Dawood Shah, Farhanullah, Naveed Malik, Amir Khan
In this proposition understanding the phenomenon of degradation and the process of degradation during the outdoor operation is presented to evaluate the PV array reliability. The value of studying degradation increases as it helps to establish acceptable standards and requirements for PV components with adequate guarantee times. With time, the major defects found in PV modules are decoloration, delimitation, glass breakage front grid finger oxidation and anti-reflective coating and back sheet bubbles. With the huge number of new solar energy, developers and site investors needed to make sure whether the panels matched the guarantee terms so that no degradation happened during the early phases of the photovoltaic plants operation, otherwise the panels would be repossessed. It led to a growing demand for laboratories that are capable of analyzing initial degradation as well as secret problem in solar PV panel and caregivers industries. The aim of this research is that we can easily predict the expected life of the solar panel and also the expected output power of the solar panel over a defined period to find the delamination ratio and quality of solar panel in the different area of Khyber Pakhtunkhwa. On the basis of which we can easily carry out the systems payback evaluation in that particular area and also assess the warranty period for that area. While two methods are followed to determine the rate of deterioration for the above mentioned reason, one is by finding the performance ratio while the other is by visual inspection.
Dawood shah Farhanullah Naveed Malik Amir Khan “Comparative Analysis of Degradation of Monocrystalline Solar Panel in three Different D International Journal of Engineering Works Vol. 9 Issue 02 PP. 39-46 February 2022 https://doi.org/10.34259/ijew.22.9023946.
[1] S. E. Forman, “Performance of Experimental Terrestrial Photovoltaic Modules,” IEEE Trans. Reliab., vol. R-31, no. 3, pp. 235–245, Aug. 1982, doi: 10.1109/TR.1982.5221326.
[2] L. N. Dumas, “Photovoltaic Module Reliability Improvement through Application Testing and Failure Analysis,” p. 7.
[3] F. J. Pern and A. W. Czanderna, “EVA degradation mechanisms simulating those in PV modules,” in AIP Conference Proceedings, Denver, Colorado (USA), 1992, vol. 268, pp. 445–452, doi: 10.1063/1.42901.
[4] F. J. Pern, A. W. Czanderna, K. A. Emery, and R. G. Dhere, “Weathering degradation of EVA encapsulant and the effect of its yellowing on solar cell efficiency,” in The Conference Record of the Twenty-Second IEEE Photovoltaic Specialists Conference - 1991, Las Vegas, NV, USA, 1991, pp. 557–561, doi: 10.1109/PVSC.1991.169275.
[5] F. J. Pern, I. L. Eisgruber, and R. H. Micheels, “Spectroscopic, scanning laser OBIC and I-V/QE characterizations of browned EVA solar cells,” in Conference Record of the Twenty Fifth IEEE Photovoltaic Specialists Conference - 1996, Washington, DC, USA, 1996, pp. 1255–1258, doi: 10.1109/PVSC.1996.564360.
[6] D. Thorp, P. Campbell, and S. R. Wenham, “Conformal films for light-trapping in thin silicon solar cells,” p. 20.
[7] D. L. King, B. R. Hansen, J. A. Kratochvil, and M. A. Quintana, “Dark current-voltage measurements on photovoltaic modules as a diagnostic or manufacturing tool,” in Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997, Anaheim, CA, USA, 1997, pp. 1125–1128, doi: 10.1109/PVSC.1997.654286.
[8] S. R. Rummel and T. J. McMahon, “Effect of cell shunt resistance on PV module performance at reduced light levels,” in AIP Conference Proceedings, Lakewood, Colorado (USA), 1996, vol. 353, pp. 581–586, doi: 10.1063/1.49388.
[9] E. L. Meyer and E. E. van Dyk, “Characterization of degradation in thin-film photovoltaic module performance parameters,” Renew. Energy, vol. 28, no. 9, pp. 1455–1469, Jul. 2003, doi: 10.1016/S0960-1481(02)00062-9.
[10] D. Romero and J. J. Laserna, “Surface and tomographic distribution of carbon impurities in photonic-grade silicon using laser-induced breakdown spectrometry,” J. Anal. At. Spectrom., vol. 13, no. 6, pp. 557–560, 1998, doi: 10.1039/a707783a.
[11] E. L. Meyer and E. E. van Dyk, “Assessing the Reliability and Degradation of Photovoltaic Module Performance Parameters,” IEEE Trans. Reliab., vol. 53, no. 1, pp. 83–92, Mar. 2004, doi: 10.1109/TR.2004.824831.
[12] W. Herrmann, W. Wiesner, and W. Vaassen, “Hot spot investigations on PV modules-new concepts for a test standard and consequences for module design with respect to bypass diodes,” in Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997, Anaheim, CA, USA, 1997, pp. 1129–1132, doi: 10.1109/PVSC.1997.654287.
[13] G. Makrides, B. Zinsser, M. Norton, and G. E., “Performance of Photovoltaics Under Actual Operating Conditions,” in Third Generation Photovoltaics, V. Fthenakis, Ed. InTech, 2012.
[14] J. Yang, A. Banerjee, T. Glatfelter, S. Sugiyama, and S. Guha, “Recent progress in amorphous silicon alloy leading to 13% stable cell efficiency,” in Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997, Anaheim, CA, USA, 1997, pp. 563–568, doi: 10.1109/PVSC.1997.654153.
[15] P. Rajput, G. N. Tiwari, O. S. Sastry, B. Bora, and V. Sharma, “Degradation of mono-crystalline photovoltaic modules after 22 years of outdoor exposure in the composite climate of India,” Sol. Energy, vol. 135, pp. 786–795, Oct. 2016, doi: 10.1016/j.solener.2016.06.047.
[16] D. C. Jordan and S. R. Kurtz, “Photovoltaic Degradation Rates-an Analytical Review: Photovoltaic degradation rates,” Prog. Photovolt. Res. Appl., vol. 21, no. 1, pp. 12–29, Jan. 2013, doi: 10.1002/pip.1182.
[17] W. Charfi, M. Chaabane, H. Mhiri, and P. Bournot, “Performance evaluation of a solar photovoltaic system,” Energy Rep., vol. 4, pp. 400–406, Nov. 2018, doi: 10.1016/j.egyr.2018.06.004.
[18] P. Rajput, G. N. Tiwari, O. S. Sastry, B. Bora, and V. Sharma, “Degradation of mono-crystalline photovoltaic modules after 22 years of outdoor exposure in the composite climate of India,” Sol. Energy, vol. 135, pp. 786–795, Oct. 2016, doi: 10.1016/j.solener.2016.06.047.15.01.015.